by: AMD
The Defect Detection accelerated application is a machine vision app that automates detection of defects, (e.g., fruits, PCBs), and sorting in high-speed factory pipelines by using Vitis Vision library functions.
Low latency defect detection pipeline
Defect detection and sorting of fruits
HDMI or DisplayPort out
User programmable Vitis Vision library functions
Complete application with hardware design
No, the app does not require any experience in FPGA design.
This application is free of charge from AMD.
No, the application has been optimized and tested for onsemi’s AR0144. To adapt the application for another sensor, you will have to update the design and optimize the application for the new sensor.
Certain AMD technologies may require third-party enablement or activation. Supported features may vary by operating system. Please confirm with system manufacturer for specific features. No technology or product can be completely secure.
